Surface metrology has to increasingly deal with the presence of sub-micron thick films, which are now being used on products well beyond semiconductor devices. Sub-micron films may be incidental – for ...

IOL power calculation based on axial length measurement with partial coherence interferometry showed no clinical advantage over applanation ultrasound biometry, according to a study. “It is generally ...

Please provide your email address to receive an email when new articles are posted on . Introduction of a new axial length measuring device could make IOL power calculations more precise and help ...

A technique called plasmonic interferometry helps to detect spatial coherence in 'incoherent' light. A technique called plasmonic interferometry helps to detect spatial coherence in 'incoherent' light ...