Conductive and photoconductive atomic force microscopy are variations of atomic force microscopy (AFM). Conductive AFM simply measures the electrical conductivity of materials while photoconductive ...
Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...
The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...
An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...
Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...
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