Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...

Conductive and photoconductive atomic force microscopy are variations of atomic force microscopy (AFM). Conductive AFM simply measures the electrical conductivity of materials while photoconductive ...

Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...

Graphene is a zero bandgap semiconductor with high electrical conductivity, making it a potential candidate for advancing the semiconductor industry. It is a highly robust material, with a tensile ...

Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

AFM can provide new insights into 2D materials to better understand their potential applications. 2D materials, such as graphene and hexagonal boron nitride (hBN), have unusual features because they ...