Reliability is as much a key to success in the microelectronicsindustry as is performance. Not only must a product perform asdesired, it must also work for an extended period of time withoutfail, ...

Researchers have developed a reliable, reproducible method for parallel fabrication of multiple nanogap electrodes, a development crucial to the creation of mass-produced nanoscale electronics.

Electromigration (EM) remains a critical reliability challenge in modern microelectronic systems, particularly as device miniaturisation and increased current densities intensify the phenomenon. In ...

As designs transition from 130nm to 90nm and below, designers must consider manufacturing effects early in the design cycle. Shrinking design nodes, larger designs, and expanding design complexity ...