Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...
Photothermal AFM-IR is a highly effective method for nanoscale chemical analysis, ideally suited to the stringent requirements of semiconductor research and production. By integrating the spatial ...
IR spectroscopy allows studying large sample areas with very high local resolution. A new detection system examines all points on the image simultaneously, ensuring average measuring time of only a ...
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