SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

They can image a wide range of materials and biological samples with high magnification, resolution, and depth of field, thereby revealing surface structure and chemical composition. Industries like ...

In 2022, the dominating segment for computer vision (CV) was quality assurance and inspection because of the rapid adoption of process automation in the manufacturing industry. One of the key benefits ...

A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering” was published (preprint) by researchers at imec, University of Ulsan, and KU ...