AFM facilitates atomic resolution imaging of insulator and conductor surfaces. One of the techniques utilizing AFM is frequency-modulation AFM (FM-AFM), which has been used for the atomic-resolution ...

Optical characterisation of thin films is a critical field that bridges fundamental research and application in materials science and engineering. It encompasses the use of various spectroscopic ...

Germany’s Fraunhofer Center for Silicon Photovoltaics (Fraunhofer CSP) is developing a range of high-resolution material and thin film microscopic and nanoscopic characterization methods to use in ...

The growing demand for sustainable energy technologies has intensified research into advanced thin-film materials capable of delivering high performance ...

The introduction of several new dielectric materials for high-speed ultra-large-scale integration (ULSI) microelectronics has increased the necessity for metrology tools to measure the ...

A variable-angle spectroscopic ellipsometer (VASE) is an essential tool for measuring the thickness of a thin film, as well as its n and k optical parameters. However, for films thinner than 10 nm, ...

(A) a single magnetic domain and (B) multiple magnetic domains with opposite polarization. (C) Following the subtraction of image (A) from image (B), a Kerr image with sharp contrast is obtained [39].

Functional polymer thin films possess many technological applications ranging from optoelectronics to sensors. Their flexibility, tunable properties, and low-cost preparation make them very appealing ...

In this article, we explore how X-ray diffraction, also known as XRD, can be used to analyze thin films and the benefits of using this technique. Many materials are now processed in the form of thin ...

insights from industryDr. Max Junda & Dr. Lyle GordonSenior Member of the Technical Staff and Director of MaterialsCovalent Metrology In this interview, AZoMaterials speaks with Dr. Max Junda, Senior ...