Abstract: Impact of strain of sub-3 nm gate-all-around (GAA) CMOS transistors on the circuit performance is evaluated using a neural compact model. The model was trained using 3D technology ...
From traditional fuses to eFuses, understanding the advantages, limitations, and use cases of each technology helps engineers ...
Crowbar circuits have long been the go-to safeguard against overvoltage conditions, prized for their simplicity and ...
Abstract: Detection and localization of early internal short circuits (ISCs) in battery packs are critical for mitigating safety risks, including thermal runaway (TR). To address this issue, this ...
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